Title :
Plasma Screening of Funnel Fields
Author :
Gilbert, R. M. ; Ovrebo, G. K. ; Schifano, J.
Author_Institution :
Harry Diamond Laboratories Adelphi, MD 20783
Abstract :
A plasma screening factor has been added to the McLean-Oldham effective funnel length model. Based on the skin depth concept, the factor is intended to provide for plasma screening of funnel fields in heavy-ion tracks crossing reverse-biased silicon and gallium arsenide junctions. Comparisons between screened-funnel predictions of prompt charge collection and experimental data show improved predictive accuracy at low and intermediate values of junction bias.
Keywords :
Alpha particles; Copper; Gallium arsenide; Ionization; Plasma displays; Predictive models; Schottky diodes; Semiconductor diodes; Silicon; Skin;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.1985.4334075