Title :
Defect level for non-equiprobable faults in digital ICs
Author :
Corsi, F. ; Del Console, D. ; Marzocca, Cristoforo
Author_Institution :
Politecnico di Bari, Italy
fDate :
4/15/1993 12:00:00 AM
Abstract :
Common measures of test efficiency are the fault coverage and the defect level for a given product yield. An extension of the well known formula relating these three quantities to the case of general non-equiprobable faults has been derived by exploiting the concept of critical area. This also leads to a more meaningful definition of fault coverage.
Keywords :
digital integrated circuits; fault location; integrated circuit testing; logic testing; probability; statistical analysis; Poisson yield model; critical area; defect level; digital ICs; fault coverage; fault probability; nonequiprobable defects; single stuck-at faults; test efficiency;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19930437
