• DocumentCode
    881266
  • Title

    Defect level for non-equiprobable faults in digital ICs

  • Author

    Corsi, F. ; Del Console, D. ; Marzocca, Cristoforo

  • Author_Institution
    Politecnico di Bari, Italy
  • Volume
    29
  • Issue
    8
  • fYear
    1993
  • fDate
    4/15/1993 12:00:00 AM
  • Firstpage
    653
  • Lastpage
    654
  • Abstract
    Common measures of test efficiency are the fault coverage and the defect level for a given product yield. An extension of the well known formula relating these three quantities to the case of general non-equiprobable faults has been derived by exploiting the concept of critical area. This also leads to a more meaningful definition of fault coverage.
  • Keywords
    digital integrated circuits; fault location; integrated circuit testing; logic testing; probability; statistical analysis; Poisson yield model; critical area; defect level; digital ICs; fault coverage; fault probability; nonequiprobable defects; single stuck-at faults; test efficiency;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19930437
  • Filename
    209929
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=881266