• DocumentCode
    881485
  • Title

    Single Event Upset in Combinatorial and Sequential Current Mode Logic

  • Author

    Friedman, Arthur L. ; Lawton, Bruce ; Hotelling, Kenneth R. ; Pickel, James C. ; Strahan, Virgil H. ; Loree, Keith

  • Author_Institution
    Questron Corporation, Los Angeles, CA
  • Volume
    32
  • Issue
    6
  • fYear
    1985
  • Firstpage
    4216
  • Lastpage
    4218
  • Abstract
    SEU testing of both combinatorial and sequential CML of identical technologies with Cf252 and Am241 heavy ion sources revealed agreement in the numbers of device disturbances in both categories of logic. The data confirms that terminal latch upset is primarily due to flip-flop toggling rather than by data path combinatorial logic disturbances.
  • Keywords
    Circuit testing; Counting circuits; Flip-flops; Ion sources; Latches; Logic devices; Logic testing; Sequential analysis; Single event upset; Strips;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.1985.4334097
  • Filename
    4334097
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=881485