• DocumentCode
    881495
  • Title

    Charge transfer efficiency in a buried-channel charge-coupled device at very low signal levels

  • Author

    Jack, Michael D. ; Dyck, Rudolph H.

  • Volume
    11
  • Issue
    1
  • fYear
    1976
  • Firstpage
    160
  • Lastpage
    166
  • Abstract
    A measurement of charge transfer efficiency (CTE) is described for a 256-element charge-coupled linear imaging device operated below room temperature and at a very low total charge level per charge packet, that is, at a level of approximately 1/20000th of saturation. This measurement was carried out at a register frequency near 15.75 kHz, the standard television-line frequency. CTE was measured by noting the dependence of the size of the principal charge packet upon the number of transfers. It was observed that at a dark current level of 4 electrons per packet and a photosignal level of 15 electrons the signal loss through approximately 250 transfers was 1/spl plusmn/5 electrons at the 50 percent confidence level. A signal-averaging technique was used to obtain this small probable error in the measurement.
  • Keywords
    Charge-coupled devices; Image sensors; Photodetectors; charge-coupled devices; image sensors; photodetectors; Charge measurement; Charge transfer; Current measurement; Dark current; Electrons; Frequency measurement; Measurement standards; Size measurement; TV; Temperature;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/JSSC.1976.1050692
  • Filename
    1050692