DocumentCode :
881509
Title :
Twin layer PCCD performance for different doping levels of the surface layer
Author :
Peek, Herman L.
Volume :
11
Issue :
1
fYear :
1976
fDate :
2/1/1976 12:00:00 AM
Firstpage :
167
Lastpage :
170
Abstract :
The performance and technology of the twin layer PCCD has been investigated for different doping levels of the surface layer. With respect to charge transfer efficiency and charge handling capacity, optimum conditions for the doping level of the surface layer can be established.
Keywords :
Charge-coupled devices; charge-coupled devices; Capacitance; Charge coupled devices; Charge transfer; Crosstalk; Diffusion bonding; Doping; Etching; Lead compounds; Metallization; Substrates;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/JSSC.1976.1050693
Filename :
1050693
Link To Document :
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