Title :
Parameter Extraction from Spaceborne MOSFETs
Author :
Buehler, M.G. ; Moore, B.T. ; Nixon, R.H.
Author_Institution :
California Institute of Technology Jet Propulsion Laboratory Pasadena, CA 91109
Abstract :
An addressable matrix of 32 CMOS transistors was designed into a test chip to be flown on the Combined Release and Radiation Effects Satellite (CRRES). In this paper the matrix is described along with a SPICE-like parameter extraction procedure called JMOSFIT, and Cobalt 60 radiation test results are presented that illustrate the shift in the 21-MOSFET parameters derived from JMOSFIT.
Keywords :
Circuit testing; Cobalt; Geometry; Inverters; MOSFETs; Parameter extraction; Radiation effects; Satellites; Single event upset; Timing;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.1985.4334101
