• DocumentCode
    881542
  • Title

    Parameter Extraction from Spaceborne MOSFETs

  • Author

    Buehler, M.G. ; Moore, B.T. ; Nixon, R.H.

  • Author_Institution
    California Institute of Technology Jet Propulsion Laboratory Pasadena, CA 91109
  • Volume
    32
  • Issue
    6
  • fYear
    1985
  • Firstpage
    4237
  • Lastpage
    4243
  • Abstract
    An addressable matrix of 32 CMOS transistors was designed into a test chip to be flown on the Combined Release and Radiation Effects Satellite (CRRES). In this paper the matrix is described along with a SPICE-like parameter extraction procedure called JMOSFIT, and Cobalt 60 radiation test results are presented that illustrate the shift in the 21-MOSFET parameters derived from JMOSFIT.
  • Keywords
    Circuit testing; Cobalt; Geometry; Inverters; MOSFETs; Parameter extraction; Radiation effects; Satellites; Single event upset; Timing;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.1985.4334101
  • Filename
    4334101
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=881542