DocumentCode :
88156
Title :
Compressive Self-Powering of Piezo-Floating-Gate Mechanical Impact Detectors
Author :
Sarkar, Pradyut ; Chakrabartty, Shantanu
Author_Institution :
Dept. of Electr. & Comput. Eng., Michigan State Univ., East Lansing, MI, USA
Volume :
60
Issue :
9
fYear :
2013
fDate :
Sept. 2013
Firstpage :
2311
Lastpage :
2320
Abstract :
This paper describes a novel compressive self-powering technique that significantly extends the powering and sensing range of our previously reported piezo-floating-gate (PFG) sensors for applications in mechanical impact monitoring. At the core of the proposed technique is a nonlinear impedance circuit that dynamically loads the output of a piezoelectric transducer in a manner such that the sensor can be self-powered at low-levels of mechanical strain and yet is able to sense and detect large variations in strain-levels. The compressive approach requires precise programming of event detection thresholds and requires precise nonvolatile event counting, both of which are achieved using variants of a linear floating-gate injector circuit. Measured results obtained from prototypes fabricated in a 0.5- μm standard CMOS process validate the proposed compressive powering and the proposed programming technique.
Keywords :
CMOS logic circuits; compressive strength; condition monitoring; energy harvesting; impact (mechanical); piezoelectric transducers; strain sensors; PFG sensors; compressive self-powering technique; event detection threshold programming; large strain-level variation detection; linear floating-gate injector circuit; mechanical impact monitoring; mechanical strain; nonlinear impedance circuit; piezo-floating-gate mechanical impact detectors; piezoelectric transducer; precise nonvolatile event counting; size 0.5 mum; standard CMOS process; Capacitance; Logic gates; Piezoelectric transducers; Programming; Strain; Switches; Transistors; Compressive powering; floating-gate transistor; mechanical impact detection; piezoelectricity; self-powered sensors; strain; structural health monitoring;
fLanguage :
English
Journal_Title :
Circuits and Systems I: Regular Papers, IEEE Transactions on
Publisher :
ieee
ISSN :
1549-8328
Type :
jour
DOI :
10.1109/TCSI.2013.2245472
Filename :
6582686
Link To Document :
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