Title :
Transients in Markov Chains
Author :
Sklansky, J. ; Kaplan, K. R.
Author_Institution :
RCA Labs., Princeton, N. J.
Keywords :
Automata; Automatic testing; Computational modeling; Performance evaluation; Stochastic processes; TV;
Journal_Title :
Electronic Computers, IEEE Transactions on
DOI :
10.1109/PGEC.1963.263601
