Title :
Current monitoring technique for testing embedded analogue functions in mixed signal ICs
Author :
Robson, M. ; Russell, G.
Author_Institution :
Dept. of Electr. & Electron. Eng., Newcastle upon Tyne Univ., UK
fDate :
4/25/1996 12:00:00 AM
Abstract :
The authors demonstrate how M-sequence and current monitoring can be combined to produce a system level technique for testing analogue circuits, much of the test hardware being obtained from reconfigured digital system hardware
Keywords :
automatic testing; integrated circuit testing; mixed analogue-digital integrated circuits; monitoring; sequences; switched current circuits; transient response; IC testing; M-sequence monitoring; analogue circuits; current monitoring technique; embedded analogue functions; impulse response testing; mixed signal ICs; reconfigured digital system hardware; system level technique;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19960557
