Title :
Statistical integrated circuit design
Author :
Director, Stephen W. ; Feldmann, Peter ; Krishna, Kannan
Author_Institution :
Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA
fDate :
3/1/1993 12:00:00 AM
Abstract :
Several statistical design methods that have been developed to minimize the effects of IC manufacturing process disturbances on circuit performance are reviewed. It is shown that statistical design problems can be expressed as optimization problems in which either the objective function or the constraint functions depend on expectations of random variables. The effectiveness of the most recent such method, the boundary integral method is illustrated with several circuit design examples
Keywords :
circuit CAD; design engineering; integrated circuit manufacture; monolithic integrated circuits; optimisation; statistical analysis; IC manufacturing process disturbances; boundary integral method; circuit design examples; constraint functions; integrated circuit design; objective function; optimization problems; statistical design methods; statistical design problems; yield maximisation; Circuit optimization; Design methodology; Distributed amplifiers; Fluctuations; Integral equations; Integrated circuit synthesis; Integrated circuit yield; Manufacturing processes; Performance gain; Temperature;
Journal_Title :
Solid-State Circuits, IEEE Journal of
