DocumentCode :
881756
Title :
Electrically erasable nonvolatile optical MNOS memory device
Author :
Koike, Susumu ; Kambara, Ginjiro
Volume :
11
Issue :
2
fYear :
1976
fDate :
4/1/1976 12:00:00 AM
Firstpage :
303
Lastpage :
307
Abstract :
A new type of nonvolatile optical memory device composed of a MNOS FET with a photosensitive region is proposed. Based upon charge transport induced by voltage change across a double insulator layer under illumination, the present device can be operated in a broad wavelength spectrum from the infrared to the visible region when provided with a d.c. bias voltage. It is found that the charge transport is a function of the exposure time as well as of the intensity of the incident light. An operation mechanism is proposed based upon the experimental results.
Keywords :
Field effect transistors; Monolithic integrated circuits; Optical storage devices; Semiconductor storage devices; field effect transistors; monolithic integrated circuits; optical storage devices; semiconductor storage devices; FETs; Insulation; Lighting; Nonvolatile memory; Optical character recognition software; Optical devices; Optical sensors; Substrates; Voltage; Writing;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/JSSC.1976.1050718
Filename :
1050718
Link To Document :
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