Title :
Error minimisation in the measurement of bipolar collector and emitter resistances
Author :
Choma, John, Jr.
fDate :
4/1/1976 12:00:00 AM
Abstract :
An analysis of open-circuited collector and forced beta methods for emitter and collector resistance determination is presented. The analysis particularly focuses attention on high-injection effects and the influences of recombination within, and at the surface of, junction depletion layers. Semiquantitative criteria for minimisation of measurement error evolve and additionally, methods for extraction of certain inverse and nonideal diode parameters are suggested.
Keywords :
Bipolar transistors; Measurement errors; Resistance measurement; bipolar transistors; measurement errors; resistance measurement; Bipolar transistors; Diodes; Electrical resistance measurement; Forward contracts; Helium; Measurement errors; Minimization methods; Semiconductor process modeling; Surface resistance; Voltage;
Journal_Title :
Solid-State Circuits, IEEE Journal of
DOI :
10.1109/JSSC.1976.1050721
