DocumentCode :
881828
Title :
Effect of reverse base current on bipolar and BiCMOS circuits
Author :
Lu, Pong-Fei ; Chuang, C.T.
Author_Institution :
IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA
Volume :
39
Issue :
8
fYear :
1992
fDate :
8/1/1992 12:00:00 AM
Firstpage :
1902
Lastpage :
1908
Abstract :
A detailed study on the effect of reverse base current (RBC) on the switching behavior of bipolar BiCMOS circuits utilizing advanced high-performance bipolar transistors is presented. It is shown that as the collector doping Nc is increased to overcome the Kirk effect (base stretching) during the switching transient, the avalanche-generated reverse base current in the collector-base junction may cause problems for bipolar output devices switching out of saturation. A basic bipolar inverter and various BiCMOS driver circuits were simulated based on measured avalanche multiplication factors from advanced bipolar transistors with various collector doping N c. In the case of the basic bipolar inverter, the reverse base current may prevent the switching device from being shut off completely during the on-to-off transition and a self-sustained state may result which reduces the output voltage swing. For the common-emitter (CE) BiCMOS driver, a similar self-sustained state may also occur with the added adverse effect of excessive leakage in standby. Design and scaling considerations are discussed
Keywords :
BIMOS integrated circuits; bipolar integrated circuits; bipolar transistors; driver circuits; emitter-coupled logic; integrated logic circuits; logic gates; BiCMOS driver circuits; ECL circuits; ECL gate; Kirk effect; advanced bipolar transistors; avalanche multiplication factors; base stretching; bipolar inverter; bipolar scaling; collector doping; common emitter BiCMOS driver; device model; reverse base current effect; self-sustained state; switching transient; BiCMOS integrated circuits; Bipolar transistors; Current density; Current measurement; Doping; Driver circuits; Inverters; Kirk field collapse effect; Switching circuits; Voltage;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/16.144682
Filename :
144682
Link To Document :
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