Title :
Radiation Damage Effects of Electrons and H, He, O, Cl and Cu Ions on GaAs JFETs
Author :
Knudson, A.R. ; Campbell, A.B. ; Stapor, W.J. ; Shapiro, P. ; Mueller, G.P. ; Zuleeg, R.
Author_Institution :
Naval Research Laboratory Washington, D. C. 20375-5000
Abstract :
Radiation damage effects have been studied in GaAs EJFETs for a variety of different energetic particles. Differences in damage rates are consistent with simple displacement damage and carrier removal.
Keywords :
Apertures; Detectors; Electrons; Gallium arsenide; Helium; Ionization; JFETs; Neutrons; Particle scattering; Semiconductor devices;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.1985.4334129
