DocumentCode :
881911
Title :
Switched-current signal processing for video frequencies and beyond
Author :
Hughes, John B. ; Moulding, Kenneth W.
Author_Institution :
Philips Res. Lab., Redhill, UK
Volume :
28
Issue :
3
fYear :
1993
fDate :
3/1/1993 12:00:00 AM
Firstpage :
314
Lastpage :
322
Abstract :
Switched-current (SI) signal processing circuits with video frequency performance are presented. The delay cells employ negative feedback to produce a `virtual earth´ at the input node to improve transmission accuracy. Fully differential structures with common-mode feedback are used to reduce charge injection errors and crosstalk from digital signals. An IC test circuit, in a 1 μm standard digital CMOS process, containing simple delay lines and an FIR filter section is described, and measured performance is given. Typically, a 2T delay line sampling at 13.3 MHz gave a low-frequency gain error of -54 dB, a settling error of -60 dB, a third-harmonic distortion of -40 dB with 75% modulation, and an S/N ratio of 60 dB. Scaling of the memory cell device dimensions and currents should permit SI operation at clock frequencies beyond 100 MHz
Keywords :
CMOS integrated circuits; VLSI; delay lines; signal processing equipment; video signals; 1 micron; 100 MHz; 13.3 MHz; 60 dB; FIR filter section; IC test circuit; S/N ratio; SNR; charge injection errors; clock frequencies; common-mode feedback; crosstalk; delay cells; delay line sampling; differential structures; digital CMOS process; digital signals; low-frequency gain error; memory cell device dimensions; modulation; negative feedback; performance; scaling; settling error; simple delay lines; switched current signal processing; third-harmonic distortion; transmission accuracy; video frequencies; virtual earth; CMOS digital integrated circuits; CMOS integrated circuits; Circuit testing; Crosstalk; Delay lines; Earth; Frequency; Negative feedback; Switching circuits; Video signal processing;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/4.209998
Filename :
209998
Link To Document :
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