DocumentCode
882008
Title
Novel technique for measuring the Q factor of thin-film lumped elements at microwave frequencies
Author
Hughes, J.J.
Volume
5
Issue
21
fYear
1969
Firstpage
535
Lastpage
536
Abstract
Using higher-order resonances, it is possible to determine the Q factors of thin-film lumped elements at microwave frequencies. This technique avoids any perturbation of the experimental arrangement which normally arises from insertion and removal of the unknown.
Keywords
Q-factor measurement; microwave measurement; thin films;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19690401
Filename
4210620
Link To Document