Title :
SNR improvement in silica-based waveguide Rayleigh backscattering measurement using a complex optical low coherence reflectometer
Author :
Takada, K. ; Yamada, H.
Author_Institution :
NTT Opto-Electron. Labs., Ibaraki, Japan
fDate :
4/25/1996 12:00:00 AM
Abstract :
The authors report a signal-to-noise ratio (SNR) improvement in the Rayleigh backscattering measurement of a silica-based waveguide over 20 cm, achieved by constructing a complex optical low coherence reflectometer with an auxiliary interferometer. The best SNR achieved is 38, which corresponds to signal fluctuations of ±0.1 dB, and the spatial resolution is 1.3 cm. The measured Rayleigh backscattering distribution clearly revealed the waveguide loss
Keywords :
Rayleigh scattering; backscatter; light interferometers; optical losses; optical testing; optical waveguides; reflectometers; silicon compounds; 20 cm; Rayleigh backscattering measurement; SNR; SNR improvement; SiO2; auxiliary interferometer; complex optical low coherence reflectometer; measured Rayleigh backscattering distribution; optical waveguides; signal fluctuations; signal-to-noise ratio improvement; silica-based waveguide; spatial resolution; waveguide loss;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19960572
