DocumentCode :
882387
Title :
On the analysis of nonlinear resistive networks considering the effect of temperature
Author :
Nemeth, K.
Volume :
11
Issue :
4
fYear :
1976
fDate :
8/1/1976 12:00:00 AM
Firstpage :
550
Lastpage :
552
Abstract :
In this correspondence a new method is presented for the analysis of nonlinear resistive networks considering the effect of the dissipated-power-dependent inner temperature of electronic devices on the electrical behaviour of circuits. It is shown that this consideration is only possible if the equations of the electrical network are extended by equations of the corresponding thermal network of the circuit and if all equations together are solved simultaneously. The temperature is introduced as variable and not as a parameter.
Keywords :
Nonlinear network analysis; nonlinear network analysis; Circuits; Diodes; Electron devices; Image analysis; Nonlinear equations; Temperature dependence; Temperature sensors; Thermal conductivity; Thermal resistance; Vectors;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/JSSC.1976.1050774
Filename :
1050774
Link To Document :
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