DocumentCode :
882414
Title :
Extended temperature range for the maximum dielectric strength
Author :
Klein, N.
Volume :
54
Issue :
7
fYear :
1966
fDate :
7/1/1966 12:00:00 AM
Firstpage :
979
Lastpage :
980
Keywords :
Breakdown voltage; Capacitors; Dielectric breakdown; Dielectric measurements; Dielectric thin films; Electric breakdown; Helium; Silicon; Temperature distribution; Thermal conductivity;
fLanguage :
English
Journal_Title :
Proceedings of the IEEE
Publisher :
ieee
ISSN :
0018-9219
Type :
jour
DOI :
10.1109/PROC.1966.4945
Filename :
1446875
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=882414
