DocumentCode
882657
Title
Application of incremental length diffraction coefficients to calculate the pattern effects of the rim and surface cracks of a reflector antenna
Author
Shore, Robert A. ; Yaghjian, Arthur D.
Author_Institution
Electromagnetics Directorate, Hanscom AFB, MA, USA
Volume
41
Issue
1
fYear
1993
fDate
1/1/1993 12:00:00 AM
Firstpage
1
Lastpage
11
Abstract
Incremental length diffraction coefficients (ILDCs) for the half-plane are integrated around the rim of a paraboloid reflector antenna to obtain well-behaved far fields of the nonuniform current for all angles of observation. These far fields, when added to the physical optics far field, produce a more accurate total far field of the reflector. Excellent agreement with the far fields obtained from a method-of-moments solution to the electric field integral equation applied to a 20-wavelength-diameter reflector shows that the cross polarization, farther-out sidelobes, and fields near nulls of reflector antennas can be appreciably modified by the fields of the nonuniform currents. ILDCs are also used to investigate the effect of cracks on the surface of reflectors that can result from the imperfect fitting together of panels to form large reflectors. Three models of cracks are studied. Significant pattern effects are found, depending on the model and orientation of the cracks
Keywords
antenna radiation patterns; electromagnetic wave diffraction; integral equations; reflector antennas; cross polarization; electric field integral equation; far fields; farther-out sidelobes; incremental length diffraction coefficients; method-of-moments solution; nonuniform current; paraboloid reflector; physical optics; radiation patterns; reflector antenna; rim; surface cracks; Aperture antennas; Moment methods; Nonuniform electric fields; Optical computing; Physical optics; Physical theory of diffraction; Physics computing; Reflector antennas; Surface cracks; Surface fitting;
fLanguage
English
Journal_Title
Antennas and Propagation, IEEE Transactions on
Publisher
ieee
ISSN
0018-926X
Type
jour
DOI
10.1109/8.210108
Filename
210108
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