Author :
Tsang, C. ; MacDonald, S. ; Samadi, G. ; Katine, J. ; Cyrille, M. ; Driskill-Smith, A. ; Ho, M. ; Moore, J. ; Weresin, W. ; Arnett, P. ; Marinero, E. ; Druist, D. ; Pinarbasi, M. ; Polcyn, A. ; Takano, K. ; Ikeda, Y. ; Do, H. ; Best, M. ; Moser, A.
Author_Institution :
San Jose Res. Center, Hitachi Global Storage Technol., San Jose, CA, USA
Abstract :
The track width performance of giant magnetoresistive (GMR) read heads defined by e-beam lithography was studied in a series of recording tests. Results on longitudinal media showed slow reductions of magnetic versus physical read widths below 100 nm due to spacing loss effects and substantial microtrack widths. These findings led to explorations of different measurement techniques to address the microtrack width issue. Results on perpendicular media showed distinctly narrower magnetic read widths consistent with modeling results assuming negligible microtrack widths. This read width narrowing effect could be another potential advantage for perpendicular media in high density recording. Finally, various parametric effects on track width performance were also explored and compared between perpendicular and longitudinal media.
Keywords :
electron beam lithography; giant magnetoresistance; magnetic heads; perpendicular magnetic recording; E-beam defined GMR read heads; E-beam lithography; giant magnetoresistive read heads; high density recording; longitudinal media; magnetic read width; magnetic read widths; perpendicular media; perpendicular recording; physical read widths; recording tests; spacing loss; spin valves; track width; Frequency; Giant magnetoresistance; Lithography; Magnetic heads; Magnetic sensors; Magnetosphere; Measurement techniques; Perpendicular magnetic recording; Spin valves; Testing;
