DocumentCode
882920
Title
Half-metallic Fe3O4 films for high-sensitivity magnetoresistive devices
Author
Takahashi, H. ; Soeya, S. ; Hayakawa, J. ; Ito, K. ; Kida, A. ; Asano, H. ; Matsui, M.
Author_Institution
R&D Group, Hitachi Ltd., Tokyo, Japan
Volume
40
Issue
1
fYear
2004
Firstpage
313
Lastpage
318
Abstract
By RF sputtering on a MgO [100] substrate, we have made Fe3O4 [111] metal and Fe3O4 [001]/TiN [001] films that have Verwey temperature (TV) near 120 K. The saturation magnetizations and resistivities of those Fe3O4 films were comparable to those of bulk Fe3O4, and the magnetoresistive (MR) ratio and MR ratio area product AΔR measured for various materials structures of current perpendicular to plane (CPP) samples using Fe3O4 [111] increased sharply at 120 K. This increase around TV seemed to be related to the change in the Fe3O4 crystal. The AΔR and MR of CPP-GMR samples using Fe3O4 [001], on the other hand, such as Ni80Fe20/TiN/Fe3O4 [001]/TiN [001], Co75Fe25/TiN/Fe3O4 [001]/TiN [001], and Fe3O4/TiN/Fe3O4 [001]/TiN [001], were 2-4 times larger than those of CPP-GMR samples using Fe3O4 [111] were. And for Fe3O4 [001] the increase of MR at TV was smaller than it was for Fe3O4 [111].
Keywords
electrical resistivity; ferromagnetic materials; iron compounds; magnetic thin films; magnetisation; magnetoresistive devices; Co75Fe25-TiN-Fe3O4-TiN; Fe3O4; Fe3O4-TiN-Fe3O4-TiN; MR ratio area product; MgO; Ni80Fe20-TiN-Fe3O4-TiN; RF sputtering; Verwey temperature; current perpendicular to plane; half-metallic films; high-sensitivity magnetoresistive devices; magnetoresistive effect; magnetoresistive ratio; materials structures; resistivities; saturation magnetizations; Area measurement; Conductivity; Iron; Magnetic materials; Magnetoresistance; Radio frequency; Saturation magnetization; Sputtering; Temperature; Tin;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/TMAG.2003.821164
Filename
1264171
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