DocumentCode
883395
Title
A stored charge model for estimating I/sup 2/L gate delay
Author
Hendrickson, Thomas E. ; Huang, Jack S T
Volume
12
Issue
2
fYear
1977
fDate
4/1/1977 12:00:00 AM
Firstpage
171
Lastpage
176
Abstract
Calculated results with this model compare favorably to those obtained experimentally. This model not only provides physical insight into I/SUP 2/L device operation, but serves as a useful tool for device and process design optimization.
Keywords
Bipolar integrated circuits; Integrated logic circuits; Semiconductor device models; bipolar integrated circuits; integrated logic circuits; semiconductor device models; Delay effects; Delay estimation; Doping; Electron emission; Epitaxial growth; Propagation delay; Region 8; Semiconductor process modeling; Solid modeling; Voltage;
fLanguage
English
Journal_Title
Solid-State Circuits, IEEE Journal of
Publisher
ieee
ISSN
0018-9200
Type
jour
DOI
10.1109/JSSC.1977.1050867
Filename
1050867
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