• DocumentCode
    883395
  • Title

    A stored charge model for estimating I/sup 2/L gate delay

  • Author

    Hendrickson, Thomas E. ; Huang, Jack S T

  • Volume
    12
  • Issue
    2
  • fYear
    1977
  • fDate
    4/1/1977 12:00:00 AM
  • Firstpage
    171
  • Lastpage
    176
  • Abstract
    Calculated results with this model compare favorably to those obtained experimentally. This model not only provides physical insight into I/SUP 2/L device operation, but serves as a useful tool for device and process design optimization.
  • Keywords
    Bipolar integrated circuits; Integrated logic circuits; Semiconductor device models; bipolar integrated circuits; integrated logic circuits; semiconductor device models; Delay effects; Delay estimation; Doping; Electron emission; Epitaxial growth; Propagation delay; Region 8; Semiconductor process modeling; Solid modeling; Voltage;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/JSSC.1977.1050867
  • Filename
    1050867