مرکز منطقه ای اطلاع رساني علوم و فناوري

DocumentCode :

883520

Title :

Foreword (June 1977)

Volume :

Issue :

fYear :

1977

fDate :

6/1/1977 12:00:00 AM

Firstpage :

215

Lastpage :

216

Keywords :

CMOS technology; Circuit testing; Computer aided analysis; Diode lasers; Gallium arsenide; Large scale integration; Low voltage; MESFETs; Paper technology; Resistors;

fLanguage :

English

Journal_Title :

Solid-State Circuits, IEEE Journal of

Publisher :

ieee

ISSN :

0018-9200

Type :

jour

DOI :

10.1109/JSSC.1977.1050879

Filename :

1050879

Link To Document :

https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=883520