Title :
A quantum gate current model
Author :
Abbott, E.B. ; Lee, M. ; Mand, R.S. ; Sweeny, M. ; Xu, J.M.
Author_Institution :
Dept. of Electr. Eng., Toronto Univ., Ont., Canada
fDate :
5/1/1993 12:00:00 AM
Abstract :
Gate current plays a critical role in the maximum gate voltage swing, the maximum transconductance, and as a direct consequence, the maximum noise margin of digital devices. A quantum gate current model based on a charge-control analysis and the WKB approximation is presented for heterostructure field effect transistors (HFETs). Both the tunneling and thermionic emission gate currents are included and treated in a unified way in this model. Along with the general model itself, a specific calculation on a semiconductor insulator semiconductor (SISFET) is presented. The model shows that for advanced HFETs with thin hetero-barrier layers, the tunneling component dominates over the thermionic component and essentially constitutes the gate current
Keywords :
WKB calculations; insulated gate field effect transistors; semiconductor device models; tunnelling; GaAs-AlGaAs; SISFET; WKB approximation; charge-control analysis; heterostructure field effect transistors; maximum gate voltage swing; maximum noise margin; maximum transconductance; quantum gate current model; thermionic emission gate currents; thin hetero-barrier layers; tunnelling gate current; Electrons; HEMTs; Heterojunctions; Insulation; MODFETs; Semiconductor device noise; Thermionic emission; Transconductance; Tunneling; Voltage;
Journal_Title :
Electron Devices, IEEE Transactions on