DocumentCode :
883866
Title :
Noise measure of microwave transistors
Author :
Fukui, Hiroshi
Volume :
54
Issue :
9
fYear :
1966
Firstpage :
1204
Lastpage :
1205
Keywords :
Circuit noise; Electrical resistance measurement; Frequency; Gain measurement; Microwave devices; Microwave measurements; Microwave transistors; Noise figure; Noise measurement; Performance gain;
fLanguage :
English
Journal_Title :
Proceedings of the IEEE
Publisher :
ieee
ISSN :
0018-9219
Type :
jour
DOI :
10.1109/PROC.1966.5083
Filename :
1447013
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=883866
