• DocumentCode
    884038
  • Title

    Software-reliability growth with a Weibull test-effort: a model and application

  • Author

    Yamada, Shigeru ; Hishitani, Jun ; Osaki, Shunji

  • Author_Institution
    Hiroshima Univ., Japan
  • Volume
    42
  • Issue
    1
  • fYear
    1993
  • fDate
    3/1/1993 12:00:00 AM
  • Firstpage
    100
  • Lastpage
    106
  • Abstract
    Software reliability measurement during the testing phase is essential for examining the degree of quality or reliability of a developed software system. A software-reliability growth model incorporating the amount of test effort expended during the software testing phase is developed. The time-dependent behavior of test-effort expenditures is described by a Weibull curve. Assuming that the error detection rate to the amount of test effort spent during the testing phase is proportional to the current error content, the model is formulated by a nonhomogeneous Poission process. Using the model, the method of data analysis for software reliability measurement is developed. This model is applied to the prediction of additional test-effort expenditures to achieve the objective number of errors detected by software testing, and the determination of the optimum time to stop software testing for release
  • Keywords
    error detection; program testing; reliability theory; software reliability; statistical analysis; Weibull test-effort; error detection rate; nonhomogeneous Poission process; software testing phase; software-reliability growth model; test-effort expenditures; Application software; Calendars; Data analysis; Phase detection; Phase measurement; Predictive models; Programming; Software measurement; Software reliability; Software testing;
  • fLanguage
    English
  • Journal_Title
    Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9529
  • Type

    jour

  • DOI
    10.1109/24.210278
  • Filename
    210278