Title :
Stand-Alone Surface Roughness Analyzer
Author :
Moslehpour, Saeid ; Campana, Claudio ; Shetty, Devdas ; Deryniosky, Brian
Author_Institution :
Univ. of Hartford, West Hartford, CT
fDate :
3/1/2009 12:00:00 AM
Abstract :
This paper details the design and implementation of a noncontact surface roughness probe from a PC-based data-acquisition system to a stand-alone measurement instrument system. A Cadence layout for the fabrication of the printed circuit board (PCB), which interfaces and drives the surface roughness probe, was used to prototype this project.
Keywords :
computerised instrumentation; data acquisition; printed circuit layout; surface roughness; surface topography measurement; PC-based data-acquisition system; cadence layout; noncontact surface roughness probe; printed circuit board fabrication; stand-alone measurement instrument system; surface roughness analyzer; Cadence layout; light-scattering techniques; optical; portable roughness evaluator; surface roughness measurement;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
DOI :
10.1109/TIM.2008.2005820
