DocumentCode
884217
Title
High-density CMOS ROM arrays
Author
Stewart, Roger G.
Volume
12
Issue
5
fYear
1977
fDate
10/1/1977 12:00:00 AM
Firstpage
502
Lastpage
506
Abstract
A single transistor cell and a precharge signal are used to reduce the memory cell area in bulk CMOS ROM arrays to 1.12 mil/SUP 2//bit. Use of SOS/CMOS technology further reduces the memory cell area to 0.38 mil/SUP 2//bit and makes possible CMOS ROMs of up to 32768 bits. Operation of both the array and the decoders is controlled by a precharge signal which is generated internally in a way which is transparent to the user. The CMOS ROMs thus produced are competitive with NMOS ROMs in both density and speed, yet retain all of the advantages of static CMOS circuits such as 1-μW power dissipation, full 2.8-15 V voltage operating range, and full -55°C-125°C temperature range.
Keywords
Cellular arrays; Field effect integrated circuits; Integrated memory circuits; Read-only storage; cellular arrays; field effect integrated circuits; integrated memory circuits; read-only storage; CMOS technology; Circuits; Costs; Decoding; MOS devices; Power dissipation; Read only memory; Temperature distribution; Voltage; Working environment noise;
fLanguage
English
Journal_Title
Solid-State Circuits, IEEE Journal of
Publisher
ieee
ISSN
0018-9200
Type
jour
DOI
10.1109/JSSC.1977.1050943
Filename
1050943
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