• DocumentCode
    884366
  • Title

    Linear compatible I/SUP 2/L technology with high voltage transistors

  • Author

    Bergmann, GÜnther

  • Volume
    12
  • Issue
    5
  • fYear
    1977
  • fDate
    10/1/1977 12:00:00 AM
  • Firstpage
    566
  • Lastpage
    572
  • Abstract
    A technology is proposed in which it is possible to realize both I/SUP 2/L circuits and linear transistors with V/SUB CBO/ of 60 V. The essential step in such a technology is an additional n/SUP +/-flat diffusion. The technological parameters are derived. From measurements on wafers processed in the outlined technology. The author established functioning I/SUP 2/L elements and high voltage transistors.
  • Keywords
    Bipolar integrated circuits; Integrated logic circuits; bipolar integrated circuits; integrated logic circuits; Atomic layer deposition; Breakdown voltage; Contact resistance; Doping profiles; Epitaxial layers; Niobium; Region 5; Safety; Space technology; Surface resistance;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/JSSC.1977.1050956
  • Filename
    1050956