Testing Microelectronic Biofluidic Systems

Author

Kerkhoff, Hans G.

Author_Institution

Univ. of Twente, Enschede

Volume

24

Issue

1

fYear

2007

Firstpage

72

Lastpage

82

Abstract

Biochips can fail because of a wide variety of reasons, ranging from electrical defects (shorts, opens, and so on) to material properties, unexpected fluidic flow patterns, and chemical or biological contamination. This article describes the way to detect and locate various types of faults in biochips. This article describes analog and digital microelectronic fluidic (MEF) arrays design and testing methods.

Keywords

bioMEMS; digital integrated circuits; fault diagnosis; field effect transistors; microfluidics; testing; FET; analog microelectronic fluidic array design; biochips; biological contamination; chemical contamination; digital microelectronic fluidics testing methods; electrical defects; fault detection; fault localization; fluidic flow patterns; material properties; microelectronic biofluidic system testing; Biomedical optical imaging; CMOS technology; Electronic equipment testing; Fluid flow control; Fluidic microsystems; Microelectronics; Microfluidics; Pharmaceutical technology; Semiconductor device testing; System testing; analog microfluidics; defect-oriented testing; digital microfluidics; flowFET; microelectronic fluidic arrays;

fLanguage

English

Journal_Title

Design & Test of Computers, IEEE

Publisher

ieee

ISSN

0740-7475

Type

jour

DOI

10.1109/MDT.2007.28

Filename

4212074