DocumentCode :
884888
Title :
ITC 2006 panels
Author :
Stolicny, Carol
Author_Institution :
Intel
Volume :
24
Issue :
1
fYear :
2007
Firstpage :
94
Lastpage :
96
Abstract :
The International Test Conference technical program has long included panel sessions that provide an informal, entertaining opportunity for ITC audiences to engage in discussion and debates with industry and research experts on a wide range of subjects. This tradition continued in a new venue in 2006 with an intriguing slate of panel sessions. In this column, the ITC 2006 panel organizers capture the deliberations and results from their respective panels for D&T readers who may not have had the opportunity to attend the conference or perhaps attended different, parallel panel discussions.
Keywords :
Bridges; Code standards; Companies; Costs; Delay; Electronic equipment testing; Redundancy; Semiconductor device testing; Standardization; Vehicle safety; ITC; International Test Conference;
fLanguage :
English
Journal_Title :
Design & Test of Computers, IEEE
Publisher :
ieee
ISSN :
0740-7475
Type :
jour
DOI :
10.1109/MDT.2007.20
Filename :
4212076
Link To Document :
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