Author :
Hiramoto, Toshiro ; Tabe, Michiharu
Author_Institution :
University of Tokyo
Keywords :
Circuits; Conferences; FETs; Laboratories; Nanoelectronics; Nanoscale devices; Quantum computing; Research and development; Silicon; Very large scale integration;
Journal_Title :
Nanotechnology, IEEE Transactions on
DOI :
10.1109/TNANO.2003.820809
