DocumentCode
884985
Title
Completeness of Sets of Delayed-Logic Devices
Author
Loomis, H.H., Jr.
Author_Institution
College of Engineering, University of California, Davis, Calif.
Issue
2
fYear
1965
fDate
4/1/1965 12:00:00 AM
Firstpage
157
Lastpage
172
Abstract
This paper concerns a property of sets of delayed-logic devices. This property, called completeness, characterizes sets of logic devices that can be used for the construction of networks to represent any finite-state machine. Associated with this property is a rate of completeness, which is the maximum input sequence rate for which any finite-state machine can be constructed from the given set of devices. Tests for completeness are presented from which the completeness or lack thereof may be determined for certain classes of sets of devices. For complete sets of devices, these tests also determine the rate of completeness.
Keywords
Binary sequences; Circuit testing; Delay effects; Frequency; Information rates; Logic circuits; Logic design; Logic devices; Switching circuits;
fLanguage
English
Journal_Title
Electronic Computers, IEEE Transactions on
Publisher
ieee
ISSN
0367-7508
Type
jour
DOI
10.1109/PGEC.1965.263960
Filename
4038394
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