DocumentCode :
885178
Title :
The new BIPM 1-V reference standard based on an array of Josephson junctions
Author :
Reymann, Dominique ; Witt, Thomas J.
Author_Institution :
Bur. Int. des Poids et Mesures, Sevres, France
Volume :
38
Issue :
6
fYear :
1989
fDate :
12/1/1989 12:00:00 AM
Firstpage :
1030
Lastpage :
1035
Abstract :
The authors report the first measurements at the Bureau International des Poids et Mesures (BIPM) with a 1-V reference standard based on an array of Josephson junctions. A novel procedure for standard cell measurements is described. It allows the measurement of a cell electromotive force (EMF) with a random uncertainty of less than 1 nV and a total uncertainty of about 2 nV while avoiding direct connection of the cell to the array. Comparisons with an older Josephson reference standard, which is based on a junction output of 10 mV, were made both indirectly by means of standard cells and directly by connecting the instruments together. The results and the random uncertainties imply that the value assigned to a standard cell using the array minus that given by the older apparatus is -18.8±3.4 nV for the indirect method and -17.1±1.5 nV for the direct method. Taking into account the estimated total uncertainty of 23.5 nV for the old system, the agreement is excellent
Keywords :
Josephson effect; calibration; measurement standards; superconducting junction devices; voltage measurement; 1 V; 1-V reference standard; BIPM; Bureau International des Poids et Mesures; Josephson junctions; array; electromotive force; random uncertainties; standard cell measurements; Force measurement; Instruments; Joining processes; Josephson effect; Josephson junctions; Lead compounds; Measurement standards; Standards development; Uncertainty; Voltage;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/19.46396
Filename :
46396
Link To Document :
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