Emitter sidewall junction capacitance in double-diffused transistors

Author

Rumin, N. ; Lawrence, H.

Volume

Issue

fYear

1966

Firstpage

1606

Lastpage

1607

Keywords

Capacitance; Continuous wavelet transforms; Difference equations; Government; Impurities; Niobium compounds;

fLanguage

English

Journal_Title

Proceedings of the IEEE

Publisher

ieee

ISSN

0018-9219

Type

DOI

10.1109/PROC.1966.5220

Filename

1447150

Link To Document