Title :
Dynamic testing of high-speed A/D converters
fDate :
6/1/1978 12:00:00 AM
Abstract :
The proposed digital techniques determine the transfer characteristics of A/D converters under dynamic operating conditions. Characteristic parameters are derived from the digital outputs of converters. Measurements show the discrepancy between static and dynamic performances.
Keywords :
Analogue-digital conversion; Integrated circuit testing; analogue-digital conversion; integrated circuit testing; Charge coupled devices; Circuit testing; Displays; Electron devices; Frequency; Oscilloscopes; Performance evaluation; Quantization; Sampling methods; System testing;
Journal_Title :
Solid-State Circuits, IEEE Journal of
DOI :
10.1109/JSSC.1978.1051056
