• DocumentCode
    885645
  • Title

    Limitation of Critical Current Density by Intermetallic Formation in Fine Filament Nb-Ti Superconductors

  • Author

    Larbalestier, D.C. ; Chengren, Li ; Starch, W. ; Lee, P.J.

  • Author_Institution
    Applied Superconductivity Center University of Wisconsin-Madison Madison, WI 53706
  • Volume
    32
  • Issue
    5
  • fYear
    1985
  • Firstpage
    3743
  • Lastpage
    3745
  • Abstract
    Two experiments have been performed to investigate the role that the intermetallic reaction between the copper matrix and the Nb-Ti filaments plays in limiting the critical current density (Jc) of Nb 46.5 wt% Ti composites. The first experiment involved composites which were industrially extruded. It was found that as the number of heat treatments increased, the Jc declined, the resistive transition broadened and the filaments sausaged. The filament sausaging was initiated by intermetallic particles at the filament matrix interface. A series of many heat treatment procedures were then applied to composites fabricated in our own laboratories without extrusion. Very high Jc values were obtained at filament sizes of 20 ¿m. When the same heat treatment procedures were applied to 4 - 5 ¿m conductors, extensive sausaging and degraded Jc values resulted. This degradation was also found to be due to the formation of Cu-Nb-Ti intermetallic compounds. It is concluded that a reliable filament diffusion barrier technology is necessary to permit full flexibility in the heat treatment of 2 - 5 ¿m filament Nb-Ti composites.
  • Keywords
    Conductors; Copper; Critical current density; Degradation; Flux pinning; Heat treatment; Intermetallic; Laboratories; Niobium; Superconductivity;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.1985.4334488
  • Filename
    4334488