• DocumentCode
    885739
  • Title

    A new buried-oxide isolation for high-speed high-density MOS integrated circuits

  • Author

    Sakurai, Junji

  • Volume
    13
  • Issue
    4
  • fYear
    1978
  • Firstpage
    468
  • Lastpage
    471
  • Abstract
    The BO-MOS has an extensive oxide-isolated structure which isolates not only the sidewall but also the bottom of the source and drain diffusions, similar to SOS-MOS, and yet it retains high carrier mobility and low-leakage junction properties. A 1024-bit static NMOS RAM is successfully fabricated using photomasks of a redesigned high-density bulk NMOS RAM (Fujitsu MBM8115). The ring oscillator circuit fabricated using existing SOS-CMOS photomasks shows an equivalent speed-power performance to the original SOS device. The fabrication sequence for the BO-MOS requires the same number of photomasks as for the conventional MOS devices.
  • Keywords
    Field effect integrated circuits; Integrated circuit technology; Integrated memory circuits; Large scale integration; Masks; Random-access storage; field effect integrated circuits; integrated circuit technology; integrated memory circuits; large scale integration; masks; random-access storage; Circuit testing; Dielectric substrates; Fabrication; Isolation technology; MOS devices; MOS integrated circuits; Production; Semiconductor films; Silicon; Temperature;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/JSSC.1978.1051078
  • Filename
    1051078