DocumentCode
885739
Title
A new buried-oxide isolation for high-speed high-density MOS integrated circuits
Author
Sakurai, Junji
Volume
13
Issue
4
fYear
1978
Firstpage
468
Lastpage
471
Abstract
The BO-MOS has an extensive oxide-isolated structure which isolates not only the sidewall but also the bottom of the source and drain diffusions, similar to SOS-MOS, and yet it retains high carrier mobility and low-leakage junction properties. A 1024-bit static NMOS RAM is successfully fabricated using photomasks of a redesigned high-density bulk NMOS RAM (Fujitsu MBM8115). The ring oscillator circuit fabricated using existing SOS-CMOS photomasks shows an equivalent speed-power performance to the original SOS device. The fabrication sequence for the BO-MOS requires the same number of photomasks as for the conventional MOS devices.
Keywords
Field effect integrated circuits; Integrated circuit technology; Integrated memory circuits; Large scale integration; Masks; Random-access storage; field effect integrated circuits; integrated circuit technology; integrated memory circuits; large scale integration; masks; random-access storage; Circuit testing; Dielectric substrates; Fabrication; Isolation technology; MOS devices; MOS integrated circuits; Production; Semiconductor films; Silicon; Temperature;
fLanguage
English
Journal_Title
Solid-State Circuits, IEEE Journal of
Publisher
ieee
ISSN
0018-9200
Type
jour
DOI
10.1109/JSSC.1978.1051078
Filename
1051078
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