DocumentCode :
885818
Title :
Lifetime Extension of RF MEMS Direct Contact Switches in Hot Switching Operations by Ball Grid Array Dimple Design
Author :
Chow, Linda L.-W. ; Volakis, John L. ; Saitou, Kazuhiro ; Kurabayashi, Katsuo
Author_Institution :
Dept. of Mech. Eng., Michigan Univ., Ann Arbor, MI
Volume :
28
Issue :
6
fYear :
2007
fDate :
6/1/2007 12:00:00 AM
Firstpage :
479
Lastpage :
481
Abstract :
Direct contact RF microelectromechanical systems switches have demonstrated excellent ultrawideband performance from dc to 100 GHz. However, they are prone to failures due to contact adhesion and arcing, particularly for pure-gold/pure-gold contacts. In this letter, we present a new contact design employing ball grid array (BGA) dimples that limit the effective contact area to a few tens of nanometers in diameter. We experimentally show the performance of the BGA dimple with pure-gold/pure-gold contacts and demonstrate RF power handling greater than 1 W during hot switching in excess of 100 million cycles
Keywords :
ball grid arrays; life testing; microswitches; microwave switches; millimetre wave devices; reliability; 0 to 100 GHz; RF MEMS direct contact switches; RF microelectromechanical systems switches; RF power handling; arcing; ball grid array dimple design; contact adhesion; hot switching operations; life estimation; lifetime extension; material reliability; microwave switches; pure-gold/pure-gold contacts; ultrawideband performance; Adhesives; Conducting materials; Contact resistance; Degradation; Electronics packaging; Materials reliability; Power system reliability; Radio frequency; Radiofrequency microelectromechanical systems; Switches; Life estimation; material reliability; microelectromechanical devices; microwave switches; power transmission reliability;
fLanguage :
English
Journal_Title :
Electron Device Letters, IEEE
Publisher :
ieee
ISSN :
0741-3106
Type :
jour
DOI :
10.1109/LED.2007.896811
Filename :
4212168
Link To Document :
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