Title :
An experimental 64-bit decoded Josephson NDRO random access memory
Author :
Henkels, Walter H. ; Zappe, Hans H.
Abstract :
The design and testing of an experimental fully decoded 64-bit Josephson NDRO (nondestructive readout) RAM chip are described. Tree decoders were used to access the memory cells. The basic memory cell was a ring cell containing a single write gate. The chips were built in a coarse 25 /spl mu/m technology since neither speed nor density were stressed in this study. An access time of 4 ns with full margins and of 2.3 ns with reduced margins were demonstrated. The corresponding full memory cycle times were 5 and 3.5 ns, respectively. Good agreement with computer simulations was obtained throughout.
Keywords :
Integrated circuit technology; Integrated memory circuits; Josephson effect; Random-access storage; Superconducting junction devices; Thin film circuits; integrated circuit technology; integrated memory circuits; random-access storage; superconducting junction devices; thin film circuits; Circuit testing; Computer simulation; Decoding; Josephson junctions; Logic circuits; Random access memory; Resistors; Superconductivity; Switches;
Journal_Title :
Solid-State Circuits, IEEE Journal of
DOI :
10.1109/JSSC.1978.1051105