DocumentCode :
886028
Title :
Estimation of junction depths in double-diffused transistors
Author :
Thomas, R.E. ; Boothroyd, A.R.
Volume :
54
Issue :
12
fYear :
1966
Firstpage :
1944
Lastpage :
1945
Keywords :
Area measurement; Avalanche breakdown; Breakdown voltage; Capacitance measurement; Circuits; Density measurement; Doping; Impedance; Particle measurements; Transmission line theory;
fLanguage :
English
Journal_Title :
Proceedings of the IEEE
Publisher :
ieee
ISSN :
0018-9219
Type :
jour
DOI :
10.1109/PROC.1966.5279
Filename :
1447209
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=886028
