• DocumentCode
    886055
  • Title

    Systematic design of phase-shifting masks with extended depth of focus and/or shifted focus plane

  • Author

    Liu, Yong ; Pfau, Anton ; Zakhor, Avideh

  • Author_Institution
    Dept. of Electr. Eng. & Comput. Sci., California Univ., Berkeley, CA, USA
  • Volume
    6
  • Issue
    1
  • fYear
    1993
  • fDate
    2/1/1993 12:00:00 AM
  • Firstpage
    1
  • Lastpage
    21
  • Abstract
    An optimization based algorithm for designing phase-shifting masks is proposed. The approach is an extension of the previous work in the sense that the intensity image is optimized at a number of optical planes rather than just the focus plane. In addition, the algorithm can be used to design masks with shifted focus plane and/or extended depth of focus. The concept of a dual mask is introduced, and its consequences for practical phase-shifting mask design are shown. The proposed design techniques are applied to single line phase connectors, cross phase connectors, contact holes and bright lines. Simulation and experimental results verify the capability of the design technique for extending depth of focus and shift the focus plane
  • Keywords
    VLSI; masks; photolithography; VLSI; bright lines; contact holes; cross phase connectors; dual mask; experimental results; extended depth of focus; optimization based algorithm; phase-shifting mask design; phase-shifting masks; photomasks; shifted focus plane; simulation results; single line phase connectors; Algorithm design and analysis; Connectors; Contacts; Cost function; Design optimization; Focusing; Nonlinear optics; Optical sensors; Simulated annealing; Very large scale integration;
  • fLanguage
    English
  • Journal_Title
    Semiconductor Manufacturing, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0894-6507
  • Type

    jour

  • DOI
    10.1109/66.210654
  • Filename
    210654