DocumentCode
886112
Title
Signal probabilities in AND-OR trees
Author
Lipsky, Lester ; Seth, Sharad C.
Author_Institution
Dept. of Comput. Sci., Connecticut Univ., Storrs, CT, USA
Volume
38
Issue
11
fYear
1989
fDate
11/1/1989 12:00:00 AM
Firstpage
1558
Lastpage
1563
Abstract
The authors consider a class of AND-OR tree circuits and study their response to random-pattern inputs as the depth of the tree is allowed to increase indefinitely. Each binary input of a circuit is independently chosen to be one (zero) with probability x (1-x). The logic of the circuit determines the probability of success (one) at the output as a monotonically increasing S -shaped function of x called the probability transfer function. The probability transfer function of an AND-OR tree is shown to have just one interior fixed point (with respect to changes in depth of the tree) in the (0.1) range of x . Its value is of interest in random testing. As the depth of the tree becomes infinite, the probability transfer function becomes a unit step with the transition point located at the interior fixed point. The authors study the convergence to the unit step as a function of the circuit depth and the fan-ins of the logic gates
Keywords
logic circuits; logic testing; probability; transfer functions; AND-OR tree circuits; S-shaped function; circuit depth; convergence; fan-ins; interior fixed point; probability transfer function; random pattern detectability; random testing; random-pattern inputs; signal probabilities; unit step; Circuit faults; Circuit testing; Computer science; Convergence; Electrical fault detection; Fault detection; Logic circuits; Logic gates; Signal analysis; Transfer functions;
fLanguage
English
Journal_Title
Computers, IEEE Transactions on
Publisher
ieee
ISSN
0018-9340
Type
jour
DOI
10.1109/12.42125
Filename
42125
Link To Document