Title :
CMOS resistive fuses for image smoothing and segmentation
Author :
Yu, Paul C. ; Decker, Steven J. ; Lee, Hae-Seung ; Sodini, Charles G. ; Wyatt, John L., Jr.
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., MIT, Cambridge, MA, USA
fDate :
4/1/1992 12:00:00 AM
Abstract :
A two-terminal nonlinear element called a resistive fuse is described. Its application in image smoothing and segmentation is explained. Two types of CMOS resistive fuses were designed, fabricated, and tested. The first implementation employs four depletion-mode NMOS and PMOS transistors, occupying a minimum area of 30 μm×38 μm. The second implementation uses seven or 11 standard enhancement-mode transistors on an area of 75 μm×100 μm or less. Individual resistive-fuse circuits have been fabricated and tested and their functionality has been demonstrated. A one-dimensional network of 35 resistive fuses using the 11-transistor implementation was also fabricated in a standard CMOS process. Experimental results indicate that the network is capable of smoothing out small variations in image intensity while preserving the edges of objects
Keywords :
CMOS integrated circuits; analogue computer circuits; field effect transistor circuits; nonlinear network analysis; picture processing; 30 to 100 micron; CMOS resistive fuses; MOSFET circuits; application; depletion mode transistors; edge preservation; enhancement-mode transistors; image segmentation; image smoothing; one-dimensional network; resistive-fuse circuits; smoothing out small variations; standard CMOS process; two-terminal nonlinear element; CMOS process; Circuit testing; Convolution; Fuses; Image segmentation; Low pass filters; MOS devices; MOSFETs; Nonlinear filters; Smoothing methods;
Journal_Title :
Solid-State Circuits, IEEE Journal of
