DocumentCode
886586
Title
Traceability for on-wafer S-parameter
Author
Bannister, D.J. ; Perkins, M.
Author_Institution
NPL, DRA Malvern, UK
Volume
139
Issue
5
fYear
1992
fDate
9/1/1992 12:00:00 AM
Firstpage
232
Lastpage
234
Abstract
A new research project is under way at the United Kingdom´s National Physical Laboratory to develop on-wafer calibration standards for automatic network analysers. The aim is to support two port S-parameter measurements of GaAs monolithic microwave integrated circuits (MMICs) in the frequency range 1-40 GHz, and ultimately to provide measurement traceability to national standards. Technical aspects of the project are summarised.
Keywords
III-V semiconductors; MMIC; S-parameters; calibration; gallium arsenide; measurement standards; microwave measurement; network analysers; 1 to 40 GHz; GaAs; III-V semiconductors; NPL; S-parameter; UK; automatic network analysers; measurement standards; measurement traceability; monolithic microwave integrated circuits; national standards; on-wafer calibration standards; traceability; two port S-parameter measurements;
fLanguage
English
Journal_Title
Science, Measurement and Technology, IEE Proceedings A
Publisher
iet
ISSN
0960-7641
Type
jour
Filename
210728
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