Title :
Recent developments in the calibration of fast fast sampling oscilloscopes
Author :
Henderson, D. ; Roddie, A.G. ; Smith, A.J.A.
Author_Institution :
Div. of Electr. Sci., NPL, Teddington, UK
fDate :
9/1/1992 12:00:00 AM
Abstract :
The impulse response and bandwidth of sampling oscilloscopes with bandwidths greater than 50 GHz have been measured in the time and frequency domain using three techniques. The results obtained have been compared and the relative merits of the methods are discussed.
Keywords :
calibration; cathode-ray oscilloscopes; electronic equipment testing; waveform analysis; 50 GHz; Fourier transform; bandwidth; calibration; electrooptic sampling; fast sampling oscilloscopes; frequency domain; impulse response; kick-out method; stepped frequency measurement; time domain;
Journal_Title :
Science, Measurement and Technology, IEE Proceedings A
