• DocumentCode
    886654
  • Title

    A model-based approach to sequential fault diagnosis - A best student paper award winner at IEEE Autotestcon 2005

  • Author

    Pietersma, J. ; van Gemund, Arjan J. C. ; Bos, A.

  • Volume
    10
  • Issue
    2
  • fYear
    2007
  • fDate
    4/1/2007 12:00:00 AM
  • Firstpage
    46
  • Lastpage
    52
  • Abstract
    Fault diagnosis is crucial for the reduction of test and integration time as well as downtime of complex systems. In this article, we present a model-based approach to derive tests and test sequences for sequential fault diagnosis. This approach offers advantages over methods that are based on test coverage of explicit fault states, represented in matrix form. Functional models are more easily adapted to design changes and constitute a complete information source for test selection on a given abstraction level. We introduce our approach and implementation with a theoretical example. We demonstrate its practical use in three case studies, and for these cases we obtain cost reductions of up to 59% compared to the matrix-based approach
  • Keywords
    fault simulation; logic testing; sequential circuits; explicit fault states; matrix form; model-based approach; sequential fault diagnosis; test sequences; Awards;
  • fLanguage
    English
  • Journal_Title
    Instrumentation & Measurement Magazine, IEEE
  • Publisher
    ieee
  • ISSN
    1094-6969
  • Type

    jour

  • DOI
    10.1109/MIM.2007.364961
  • Filename
    4213134