Title :
Latchup Paths in Bipolar Integrated Circuits
Author :
Baze, M.P. ; Johnston, A.H.
Author_Institution :
Boeing Aerospace Company Seattle, Washington 98124
Abstract :
A combination of experimental techniques was used to find latchup paths in bipolar circuits. Voltage contrast scanning electron microscopy was applied as an internal probe to analyze latchup paths. Data obtained on six device types show a variety of path combinations and interactions responsible for latchup.
Keywords :
Bipolar integrated circuits; Infrared imaging; Integrated circuit measurements; Linear accelerators; Linear particle accelerator; Optical pulses; Photoconductivity; Probes; Scanning electron microscopy; Voltage;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.1986.4334630
