Title :
Numerical Simulation of SEU Induced Latch-Up
Author :
Rollins, J.G. ; Kolasinski, W.A. ; Marvin, D.C. ; Koga, R.
Author_Institution :
The Aerospace Corporation M4-990 PO Box 92957 Los Angeles CA 90009 and University of Southern California University Park Los Angeles CA 90089-0271
Abstract :
The PISCES-II device analysis program has been modified to perform two-dimensional SEU induced latch-up simulations. The results of the simulations have been compared to cyclotron test data taken on a custom test chip. The comparison indicates that the simulations are accurate for light ions. A description of the latch-up process is also given.
Keywords :
Aerospace simulation; Aerospace testing; Analytical models; Anodes; Cyclotrons; Numerical simulation; Performance analysis; Semiconductor device modeling; Silicon; Strips;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.1986.4334642
